Test solution
Test solution
The company is committed to building a platform that is most suitable for customization needs and continuously verifying it to finally form a solution.
At present, more than 30 chip testing solutions have been developed, including MCU chip, ADC chip, FPGA chip, GPU chip, video chip, RF chip, SoC chip, digital signal processing chip, etc.
SOC chips need to process a huge amount of data, with many chip pins and large vector depth. In view of the above characteristics of this kind of chip, the company has realized the parallel test of full coverage of multi station data with the testing machine by using the multiplexing technology of digital channels and the primary and secondary call technology of vectors, combined with the data processing algorithm.
Hisemi provides a complete testing platform to support the testing requirements of various SOC chip products. See the following table for the test platform:
| Vendor | Model | Rate |
| Advantest | V93000 | 200 Mbps ~ 16 Gbps |
| Teradyne | J750/J750EX | 100 MHz /200 MHz |
| YTEC | S100 | 100 MHz |
| Chroma | 3380P | 100 MHz |
| LTX-Credence | D10 | 200 Mbps |
The company is one of the companies that carried out the research on the test scheme of fingerprint identification chip earlier in China. With strong research and development capabilities, it has achieved the successful research and development of the test scheme of capacitive plane strip fingerprint chip, capacitive side fingerprint chip, capacitive arc fingerprint chip and optical fingerprint chip.
Hisemi provides a perfect testing platform to support the testing requirements of various fingerprint chip products. See the following table for the test platform:
| Vendor | Model | Rate |
| Chroma | 3380P | 100 MHz |
| YTEC | S100 | 100 MHz |
Aiming at the problems of mutual interference between multiple stations, interference in the test environment and high requirements for the test platform and test circuit in the test of high-speed RF chips, the company adopts the test method of setting different frequency bands for different stations and shielding the signals to realize the multi station parallel test. This test technology has the function test under various modes, such as current test under carrier mode and RF communication test, Send relevant command signals to the standard samples through the testing machine, judge whether it is good or bad by the number of packets received, and then analyze the commands through asynchronous serial port communication.
Hisemi provides a complete testing platform to support the testing requirements of various RF chip products. See the following table for the test platform:
| Vendor | Model | Rate |
| National Instruments | STS T4 | 12.5Gb/s |
| YTEC | S100 | 100 MHz |
| Chroma | 3380P | 100 MHz |
| LitePoint | IQxstream |
Hisemi has a complete range of test platforms and skilled test engineers to provide customers with the development of test programs for analog products. For example, the test program development and mass production test of linear circuits such as operational amplifiers, power amplifier circuits, motor drive circuits, power management circuits, radio circuits and other analog circuits.
Hisemi provides a variety of test platforms to support the test requirements of analog chip products. See the following table for the test platform:
| Vendor | Model | The configuration |
| ACCOTEST | STS8200B | FPVI*4,FOVI*4,HVIIK*1,QTMU*1,ACSM*1, DIO*1 |
| TRI | TR6850S | DVC*2,OVC*4,QTMU,AWG,PEB32 |
| ChangChuan | CTA8200 | DVI*1,QVI*1,OVS*1,PVM*1, QTMU*1,HKV*1 |
| Powertech | QT8100 | APU16*2,PVC40*1,PVI1000*1, PMS4*1 |
| HongBang | T862 | DDD*1,DVI*1,HVS*1,OV2*1 |
The company has tested a large number of consumer ICs, and the main products tested include: flash chips; Music chips; Voice chip; Clock chips; Calculator chips; Remote controller chips; Electric toy coding, decoding, driver chip, led, LCD driver chip, etc. Provide program development and related technical services to customers.
Hisemi provides a variety of test platforms to support the test requirements of most consumer chip products. See the following table for the test platform:
| Vendor | Model | Rate |
| YTEC | S50 | 50 MHz |
| YTEC | S100 | 100 MHz |
| Chroma | 3360D/P | 50 MHz |
| Chroma | 3380D/P | 100 MHz |
| ChengZhi | TQT500/TQT500B | 1 MHz |
| VTT | V7100 | 10 MHz |
The company provides discrete device testing and program development services. At present, it has covered the testing and program development of transistors, MOSFETs, diodes, Zeners, Zeners, TVs and other products.
Hisemi mainly has a dts1000 test platform to support the test requirements of discrete device products. See the following table for the test platform:
| Vendor | Model | The configuration |
| JUNO | DTS1000 | 999V,30A |
